PublishYou are here: Home » Products » Machinery & Parts » Industrial Measuring, Testing & Inspection Equipme » Industrial Testing & Inspection Equipment

Wafer Tester, Monitoring Defects and Contamination in the Bulk Region of Si Wafer
Original
price: Negotiable
minimum:
Total supply:
Delivery term: The date of payment from buyers deliver within days
seat: Beijing
Validity to: Long-term effective
Last update: 2017-10-25 23:17
Browse the number: 51
inquiry
Company Profile
 
 
Product details
Model Number: KP - A65 Key Specifications/Special Features: Special features:Monitoring defects and contamination in the bulk region of Si waferKey specifications:Impurities due to heavy metal contaminationCan detect Co, Ni, Ti, Mo, W, Pt, Au and PdCan detect but not identify them uniquelyCan detect and identify Cu and CrIron concentration determination both in CZ and FZ wafers
  • Requires surface passivation: thermal oxide, chemical passivation or corona charging
  • Can be combined with the SPV, VQ and JPV
  • Integrated FOUP and mini environment
    • Main Export Markets:
    • Asia
    Total0bar [View All]  Related Comments
     
    more»Other products
    Wall-mounted Fan Heater with Electric-type Fuel and Fully Automatic Remote Controller Wafer Tester, Monitoring Defects and Contamination in the Bulk Region of Si Wafer PR Strip System

    [ Products search ] [ favorites ] [ Tell friends ] [ Print ] [ Close ]